Application:
Burn in oven can be applied to testing of electronic devices, ICs and miscellaneous other semiconductor devices.
Features of Burn In Oven:
- Highly customized oven design according to specific user requirements
- Multi safety protection
- Uniform air circulation across chamber
Testing Standards of Burn In Oven:
IEC 60068-2-1: 2007, IEC 60068-2-2: 2007, IEC 60068-2-14: 2009, GB/T 11158: 2008, GB/T 2423.2: 2008, GB/T 30435: 2013.
Technical Parameters:
| Model | SZ-BIO-12C、SZ-BIO-24C、SZ-BIO-36C、SZ-BIO-48C、SZ-BIO-78C | |
| BIB slots | 12 BIB slots、24 BIB slots 、36 BIB slots、48 BIB slots、78 BIB slots | |
| Size | Customized as per testing requirement | |
| Temperature range | RT+20℃~+200℃ | |
| Temperature fluctuation | ±0.5℃ | |
| Temperature deviation | ≤±2℃ | |
| Temperature uniformity | ≤±2℃ | |
| Heating rate | RT→+200℃≤25min | |
| Cooling rate | 200℃→50℃≤30min (fast cooling designed to save waiting time and improve fab productivity) | |
| Our strength | Highly customized oven design according to specific user needs catering to BIB, feed through, backplane and driver board dimensions. Full range of sensors equipped (over-temperature protector in multiple spots, under-temperature sensor, airflow meter, air pressure differential sensor, interlock sensor etc.) | |
| Optional | Additional built-in refrigeration unit to provide minus temperature conditions to fulfill HTOL and LTOL test requirements. | |


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